OTF STUDIO:  THIN FILM SOFTWARE FOR ANY CHALLENGE


New features and fixes are here.


Most recent versions 26.25:

  • Multiple Color Evaluation panels.
  • Tabulate functions
  • Angular derivatives in 2D and 3D
  • Algorithms enhancements for tricky phase-related tasks. 
  • History in CH and RE. 
  • Import from Avantes spectrophotometers. 
  • More...

With OTF Studio Software, you can tackle multilayer design challenges of any complexity. It offers powerful design and analysis tools, including synthesis algorithms enhanced with machine learning elements.

For trial versions, please reach out to our distribution partners.

OTF Studio workshop is an excellent opportunity to learn more about tits capabilities and gain hand-on experience. 


 Periodic multilayers with shifted ratios of high and low index layers in the half-wave pairs

Notch small1

Fig. 1. Schematic representation of a quasi-notch filter exhibiting high-reflection zone HR centered around a central wavelength \(\lambda_0\).  There are two possible structures S1 and S2.

Here you can estimate reflectance at central wavelength and width of HR zones of the quasi-notch filters of different structures (s-polarization case). Input the parameters required for calculations:

Fraction of quarter wave p (0.0-1.0):   =    Central wavelength (100 nm - 25000 nm) nm    Number of layer pairs: m   =

Refractive indices of layer materials: n1  = n2  = Substrate refractive index: ns  = Angle of incidence (0-89 degrees): degrees

Download notch filter estimations (*.xls)

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