OTF STUDIO:  THIN FILM SOFTWARE FOR ANY CHALLENGE

Next Workshop: 11.06.2025 - 13.06.2025

Location: Leica Welt, Wetzlar, Germany

Neubau Leica Camera Fassade

Photo: Hanneke Heinemann

Agenda and important information

The workshop is fully booked, no more registrations. We will plan another workshop for fall.

New features, updates, and bug fix are here.


The most recent version 25.33:

  •  Stress and thickness optimization/compensation targets.
  •  BoundTrap design feature.
  •  Import of measurements by Drag&Drop.
  •  Expressions in 2D and 3D plots.
  •  Iso-reflectivity curves on Admittance panel. 

We actively participate in international conferences and meetings

2025

OTF Studio participated in OIC 2025 conference. Our contributions:


Jörg Terhürne, Stefan Bruns, Tatiana Amochkina, Philipp Farr, Thomas Melzig, Michael Trubetskov, Optical Characterization of Si-SiO2 Quantizing Nanolaminates

Presenter: Dr. Stefan Bruns

Learn more at the BTE website.


Tatiana Amochkina, Michael Trubetskov, Petar Pervan, Vesna Janicki, Smart Color Designs with Ag and Au Metal-Island Films

We design multilayer structures incorporating silver and gold metal-island films in two different embedding materials SiO2 and Y2O3 to achieve the reflectance of three distinct colors. The designs are specially adjusted for micro and nanoarray fabrication to involve the least number of deposition runs. The designs shown in the picture are obtained using one synthesis run using a sophisticated combination of algorithms and features of OTF Studio software.

Presenter: Dr. Tatiana Amochkina


Tatiana Amochkina, Alexander Myslivets, Nadzeya Khinevich, Jordi Sancho-Parramon, Vesna Janicki, Michael Trubetskov, Characterization of PARMS Produced 1-µm thick Ta2O5 and SiO2 Monolayers in 0.35-5 µm Spectral Range

Layer materials Ta2O5 and SiO2 are widely used for production of optical coatings in the broadband spectral ranges. Optical properties of PARMS produced monolayers were characterized based on spectral and ellipsometric data using two software tools. Layer thicknesses on the Fused Silica and Si substrates are different. It was assumed that the reson is different thermal behaviour of two substrate. It was very interesting to discuss at the poster session.

Presenter: Dr. Tatiana Amochkina

 


Tatiana Amochkina, Vladislav Matusevich, Jordi Sancho-Parramon, Michael Trubetskov, Reliable Characterization of SK-1300, MgF2, ZnSe, and Si Substrates in 0.2-4.2 µm Spectral Range

Precise knowledge of substrate optical properties is essential for the theoretical design and monitoring of optical coatings, layer characterization, and reverse engineering of fabricated multilayers. We demonstrate a reliable method for substrate characterization.

Presenter: Dr. Tatiana Amochkina


2024
  • R. Benz, M. Nazari, T. Amochkina, M. Trubetskov, Optimizing thin-film material combinations for immersed narrow-bandpass filters in the VIS and NIR range, SPIE Optical Systems Design, Strasbourg, 7-11 April 2024
  • T. Amochkina, V. Shandarovich, D. Kisel, M. Trubetskov, A. Myslivets, Advanced characterization of IBAD deposited MgF2, Al2O3, Si, YF3, and Ge thin films in ultra-broadband spectral region of 300-5000 nm, SPIE Optical Systems Design, Strasbourg, 7-11 April 2024
  • T. Amochkina, M. Trubetskov, V. Janicki, J. Sancho-Parramon, Reliable post-production characterization of TiO2/SiO2 electron-beam optical coatings based on multi-sample photometric and ellipsometric data, SPIE Optical Systems Design, Strasbourg, 7-11 April 2024
  • T. Amochkina, V. Matusevich, M. Trubetskov, Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data, SPIE Optical Systems Design, Strasbourg, 7-11 April 2024
  • T. Amochkina, D. Hahner, M. Trubetskov, V. Pervak, F. Krausz, Post-production characterization of double-sided ZnS/YbF3 mid-infrared thin-film optical elements, SPIE Optical Systems Design, Strasbourg, 7-11 April 2024
  • T. Amochkina, M. Trubetskov, Synthesis of broadband dispersive mirrors within the spectral range of 3-18 µm: algorithms and challenges, OCLA Symposium, Buchs, 16th April 2024
  • T. Amochkina, M. Trubetskov, Modern and efficient methods for multilayer coating design, Workshop on Optical Thin Films, 22.04-24.04.2024, IRB, Zagreb.

    Buchs

2023
  • T. Amochkina, V. Matusevich, M. Trubetskov, Verschiedene Ansätze zur Charakterisierung von elektronenstrahl-verdampften optischen Beschichtungen basierend auf spektralfoto- metrischen und ellipsometrischen Messdaten, Fokusgruppe DUV / VUV, 15.11.2023, VON ARDENNE GmbH, Dresden
  • H. Kassab, S. Gröbmeyer, C. Hofer, W. Schweinberger, Ph. Steinleitner, M. Högner, T, Amotchkina, M. Knorr, R. Huber, F. Krausz, N. Karpowicz, I. Pupeza, Bright phase-stable waveforms covering the entire infrared molecular fingerprint region, will be presented at CLEO Europe in Munich,  CD-7.2 8:45 Room 14a ICM
2022

2021

2020

2019

If you are interested in our software, please get in touch with our authorized distribution partners. If you are outside of the distributor regions below, please contact directly OTF Studio.

    • In the United States of America and Canada, and Australia

      Dr. James Oliver, Miss Marcella Oliver

      E-Mail: [email protected]

      Phone: +1 585-298-9579

    • In South Korea, Taiwan, Malaysia, Singapore, Thailand, and Vietnam

      Mr. Tadashi Watanabe

      E-Mail: [email protected]

      Phone: +81-90-3558-5986

        • In Saudi-Arabia, United Arab Emirates, Egypt, Qatar

          Mr. Oğulcan Açikgöz

          E-Mail: [email protected]

          Phone: +90 312 909 3335/2506

        • In Israel

          OTF Studio GmbH

          E-Mail: [email protected]

          Phone: +49(0)89 209 75 338

           

          Michael Trubetskov is winner of all recent optical interference coatings design contests

          Network:  optence grau rot