OTF Studio®
Thin Film Software for Any Challenge
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OTF Studio,® developed since early 2023, is a modern solution for the design, analysis, monitoring, and reverse engineering of multilayer optical coatings. The software is already well established in the industry, recognized for its rapid evolution, robust software architecture, and advanced capabilities.
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Powered by a newly developed, highly effective computational framework, OTF Studio® ensures both computational speed and stability in performance. Continuous innovation and integration of user feedback have quickly made it a reliable and leading tool for professionals in the optical thin-film field.
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Learn more in Development history
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Modern, fast, effective, intuitive, and user-friendly
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Functionalities required for optical coating designers
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Thin-film designs of any complexity
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Highly effective state-of-the-art software solutions
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Flexible and reliable reverse engineering models
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Original and smart algorithms for characterization of monolayers
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Easy import of measurement data from many spectrophotometers, ellipsometers, Excel files, and via drag-and-drop
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Modern chart designer, plotting, dashboard layout, 2D and 3D plots
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Project management using standard operations (new, open, save, save as) available at Quick Access Toolbar or using a standard back-stage interface
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Modern ribbon interface
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Customizable layout
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Docking technology for tables, panels, and plots
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Special design options for ultrafast applications
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Color design and analysis options; color diagrams, color differences, color patch
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Electric field optimization
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Integral values
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Stress and thickness optimization
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U- and g-values according to EN 410/673, NFRC Winter, and NFRC Summer
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Multi-scan measurements and processing
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Batch measurements, batch processing, and visualization
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Multi-Environments
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Monte-Carlo analysis and yield analysis; worst case performance
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Interactive analysis tools operating for all active plots and panels in dashboard layout
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Interactive Admittance diagram including iso-reflectivity curves
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Expressions and linked expressions
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Specification of Machine and automatic generation of advanced monitoring strategies
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Generation of monitoring spreadsheets
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Special design and analysis options for Multi-QWOT narrow band pass filters
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My Catalog feature for layer materials, substrates, and light sources
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Non-parametric model for complex characterization problems
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Reports including plots directly to Word, pdf, Excel, or to print
