OTF Studio

Thin Film Software for Any Challenge

(Development history)

• Modern, fast, effective, intuitive, and user-friendly

• • Functionalities required for optical coating designers

  • Thin-film designs of any complexity

  • Highly effective state-of-the-art software solutions

• Flexible and reliable reverse engineering models

• Original and smart algorithms for characterization of monolayers

• Easy import of measurement data of different types

• Modern chart designer, plotting, dashboard layout, 2D and 3D plots

• Project management using standard operations (new, open, save, save as) available at Quick Access Toolbar or using a standard back-stage interface

• Modern ribbon interface

• Customizable layout

• Docking technology for tables, panels, and plots

• Special design options for ultrafast applications

• Color design and analysis options

• Integral values

• U- and g-values

• Multi-scan measurements

• Batch measurements

• Large variety of import and export options

• Multi-Environments

• Monte-Carlo analysis and yield analysis; worst case performance

• Interactive analysis tools operating for all active plots and panels in dashboard layout

• Expressions

• Automatic generation of advanced monitoring strategies

• Special design and analysis options for Multi-QWOT narrow band pass filters