OTF Studio
Thin Film Software for Any Challenge
(Development history)
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Modern, fast, effective, intuitive, and user-friendly
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Functionalities required for optical coating designers
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Thin-film designs of any complexity
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Flexible and reliable reverse engineering models
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Original and smart characterization algorithms
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Highly effective state-of-the-art software solutions
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Easy import of measurement data
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Modern chart designer
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Project management using standard operations (new, open, save, save as) available at Quick Access Toolbar or using a standard back-stage interface
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Modern ribbon interface
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Customizable layout
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Docking technology for tables, panels, and plots
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Special design options for ultrafast applications
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Color design and analysis options
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Integral values
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U- and g-values
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Multi-scan measurements
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Batch measurements
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Large variety of import and export options