OTF STUDIO:  ALL  IN  A  NEW  LIGHT

Recent News

    New version of OTF Studio 24.53 is released

    OTF Studio Workshop

    Save the date: 11.06.-13.06.2025

    Location: Leica Welt, Wetzlar, Germany

    Neubau Leica Camera Fassade

    Photo: Hanneke Heinemann

    Information will be provided at the beginning of the next year.

    We look forward to seeing you at our booth 303 at the OIC 2025 Optica exhibition,

    18.05-23.05.2025, Tucson, Arizona USA

    Tucson small

        • Thin Film Software

        • We present our new OTF Studio® Thin Film Software for design, analysis, monitoring, and post-production characterization of multilayer optical coatings.

        • Our software product taReo is an advanced software tool specifically developed to assist in the production of multilayer optical coatings within deposition chambers equipped with broadband optical monitoring.

        • New features are being developed. Please visit development history for more information.

        • Customer-oriented projects

          • Our expertise lies in creating software tailored to meet the needs of our customers, specifically in the areas of design, characterization, simulation, and implementation in real production environments.
          • We have the ability to propose design solutions that are production-friendly and meet the requirements of actual deposition environments.
          • Collaboration opportunities with other companies or academic institutes are also welcomed as we are open to engaging in joint projects.

          • THIN FILM CONSULTING

            • OTF Studio offers consulting services for thin-film design, characterization, and implementation of our software in real production environment. Our expertise covers the design of optical coatings for various applications, ranging from laser technologies to architectural glass.
            • Our range of services includes on-demand consulting, workshops, and training programs in the field of thin film design and characterization.
            • Additionally, we conduct characterization of single layers and multilayer coatings using spectral photometric and ellipsometric techniques.

            New features, updates, and bug fix are here.

            The most recent: Enhancements of batch processing; export to Shincron files; links in monitoring runsheets;

            Also: Number of parameters in the RE;  automatic normalization of illuminant and detectors.


            Interested?

            Please contact us per e-mail This email address is being protected from spambots. You need JavaScript enabled to view it.

            or per telephone +49(0)89 209 75 338

            Our Privacy Policy is here

             

            Michael Trubetskov is winner of all recent optical interference coatings design contests

              Network:  optence grau rot

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